Peel Back Force Tester

GPD's Peel Back Force Tester with FORCEWare™ software is being used to set peel back standards for the entire industry
Proven Peel Back Force Measurement

Supplying consistent SMT carrier packaging is critical for customers using SMT pick-and-place machines. Noth- ing will stop a production line faster than carrier cover tape that doesn't peel back properly. The problem is difficult because tape cover adhesive varies widely from supplier to supplier.

in short, correctly measuring, setting up, recording, and then analyzing carrier tape peel back force is a critical production step. That's why you need GPD's Peel Back Force Tester (PBFT) with FORCEWare™ software. This is the equipment judged so good it was used to set the peel back force standard for the entire industry.

|
|
Kit PBT-107 includes 50, 100, & 200 g weights
Kit PBT-123 includes 20, 50, 100, & 200 g weight

installation and Set Up
configuration of the PBFT is quick and easy using the PBFT calibration dial and the strain gauge calibration screen

Strain Gauge Verification Kit
This optional kit makes it easy to verify strain gauge calibration and meet ISO requirements for calibrated equipment
GPD's FORCEWare™ Software
lets you interface directly with your computer

|
FORCEWare™ Software |
SPC Analysis |
|
FORCEWare™ software allows the user to see, analyze, and record minimums, maximums, and average peel back force and speed, as well as standard deviation. GPD Global's FORCEWare™ Software with comprehen- sive SPC Software Package makes testing and evalua- tion quick, easy, and accurate. |
When sufficient SPC data has accumulated, it can be analyzed with any of the various window interfaces shown in the samples here. All you have to do is se- lect the file to be analyzed, a data range, and the type of graph desired. Then simply printout or display the output. |
|
|
|
|
PBFT Control Center Window |
SPC User Creation Window |
|
The PBFT Control Center Window is used to define test parameters and unit of measure, run a test, and view, print, and save results. This window is also used to view and compare prior test results. |
In addition to generating SPC data reports, the operator can also create separate log-in accounts, as well as implement- ing vendor defaults. Security features prevent unauthorized tampering. |
Control · Information · More Efficient Production
|
Test Graph |
![]() |
|
When a peel back force test begins, its progress displays on the test graph. Upon test completion, specific and summary data are displayed in a Test Results window. Many different graph forms can then be generated. |
|
|
Current Results Chart |
![]() |
|
Displays complete results of test. Results can be saved and reviewed |
FORCEWare™ Software with SPC Software Package Runs on Windows 10 Pro/ 8 Pro/7 Pro
Now the most accurate method of testing is also the easiest and fastest. With easy to use, point-and-click windows, initial set up is a breeze, and calibration routines for both speed and force are practically automatic. SPC analysis allows the operator to select the files to be analyzed, and pick the appropriate analysis tools. Analysis, and all management results can be printed out for further study or distribution.
SPC Reports and Labels
SPC test results can be printed in SPC data, line graph, and label
formats. The user can control the overall dimensions for all of these formats. User-defined print can also be added at the bottom of the SPC data and line graphs reports


Simplified calibration routine for speed and force
Selectable sampling rate
Bright, clear, easy-to-read screens
Large storage capability for test data, test
graphics, and SPC data
Previous Results Chart
This display is used to load previous results and past tests, in addition to generating additional results output.
S-Chart, X-Bar Chart, R Chart, and Cpk
Displays trends in spread of standard deviation, mean, range, and Cpk.

Features of the variable speed Peel Back Force Tester with FORCEWare™ software package


Hot Tags: peel back force tester, China peel back force tester factory, semiconductor test accuracy, semiconductor test development, semiconductor test operation, ic test implementation, Thermal Characterization System for Power Devices, ic test customization





