IOL Intermittent Life Test System
All test stations of the system are connected in parallel to ensure highly consistent test currents for each channel. 8 test channels (one board, one zone) for GK-IOL-X8 and 16 test channels for GK-IOL-X16 are equipped with test capacities of up to 384 and 768 respectively, which can satisfy test tasks of different scales. Each channel is equipped with a set of independent programmable power supply, which supports flexible settings for Ton/Toff, Vgs, IM, Ids, Vds, fan mode and other rich test parameters, and all workstations support Tj detection to ensure the accuracy and reliability of testing.
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Intermittent Life Test System |
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Product model |
GK-IOL-X8 |
GK-IOL-X16 |
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Scope of application |
Suitable for intermittent and steady-state life testing of Si/SiC diodes, transistors, MOSFETs, IGBTs and other devices in various packaging forms. |
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Features |
1,Real time measurement of the junction temperature Tj of the sample during the experiment and display of the junction temperature difference △ Tj; 2,Adopting modular design, each module is an independent testing unit. Each module has an independent test chamber, truly achieving complete independence between boards. The air ducts of each test unit do not affect each other; 3,In debugging mode, whether in the on or off state, the junction temperature Tj can be collected every second, and a complete temperature change curve can be drawn to prevent device damage when searching for test conditions; 4,All stations are connected in parallel, and the test current remains consistent; 5,Equipped with VF compensation function; 6,Curve fitting function, obtain the corresponding VF at time t=0, and calculate the true Tj |
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Test channel |
8(One board, one zone) |
16(One board, one zone) |
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Test capacity |
48×8=384 |
48×16=768 |
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Basic function |
①Each channel provides a set of independent programmable power supplies; ②Test parameters (Ton/Toff, Vgs, IM, Ids, Vds, fan mode); Support Tj detection for all workstations; ③For diodes and IGBTs, series mode is adopted, and the test current range for each workstation is 0-20A; For MOS, parallel connection is adopted, with constant current at each workstation; ④Each channel provides a set of independent programmable power supplies; ⑤Real time display of aging parameters and depiction of complete change curves; ⑥Real time judgment of whether the limit is exceeded, alarm for exceeding the limit, and record the exceeding station and exceeding time; |
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External dimensions |
W1140mmхH1820mmхD1320mm |
W1620mmхH1820mmхD1320mm |
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Weight |
about 500kg |
about 800kg |
