Integrated Circuit Service Life Test System
HTOL Integrated Circuit Service Life Test System
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One board, one zone, can meet the simultaneous burn-in of 8 devices with different test parameters.
2
A configurable graphics generation system suitable for dynamic excitation burn-in, scan chain testing, and built-in self testing.
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Integrated Circuit Service Life Test System |
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Product model |
GK-ICHTOL-2000 |
GK-ICLTOL-800 |
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Scope of application |
Suitable for working life testing and high-temperature dynamic burn-in screening of various packaging forms of digital, analog, and mixed digital analog integrated circuits, including microprocessors, logic circuits, programmable devices, memory, A/D, D/A and other devices. |
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Features |
1,One board, one zone, can meet the simultaneous burn-in of 8 devices with different test parameters. 2,A configurable graphics generation system suitable for dynamic excitation burn-in, scan chain testing, and built-in self testing. |
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Test capacity |
40×16=640 |
40×8=320 |
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Basic function |
Real time monitoring of the test current of each product, with 40 current detection channels provided in each slot. The current detection range of each channel is 0-600mA, with a resolution of 0.1mA. When the test device requires a larger current, multiple channels can be connected in parallel, and a maximum current of 24A can be provided for a single device; |
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External dimensions |
W1400mmхH1950mmхD150 0mm |
1800mm(W)×1500(D)mm×2000mm(H) |
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Weight |
about 600kg |
about 700kg |
