Ultrasonic Scanning Microscope: The device is used to detect all kinds of semiconductor devices and materials, and can detect defects such as pores, cracks, inclusions and delamination inside the sample, and display them visually in a graphical way.
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Equipment Size |
1000mm×900mm×1400mm |
Power Supply |
AC 220V, 10A |
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Internal Tank Size |
620mm×650mm×150mm |
Source Gas |
CDA |
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Effective Scanning Area |
350mm×300mm×100mm |
Water |
DI water |
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Max Scanning Speed |
600mm/s |
Product Feature And Application
- The scan results are clear and accurate.
- Defect recognition up to 0.15mm.
- Powerful software: standard measurement mode, prescription editing mode, equipment maintenance mode.
- Multiple scanning modes: A scan, C scan, T scan, area scan, batch scan.
- The probe is aligned with the C-scan image.
- Automatic report generation
- Automatic statistics and calculation of defect size and area
- One-click automatic calibration
- Multi-layer scanning function at a time
- Thickness detection, density detection, fault detection, sound velocity detection.
Production Details
Our Factory And Workshop
Certificate
Cooperative Partner
FAQ
Q: What is SAT?
A: Ultrasonic scanning microscope (SAT) is a kind of non-destructive testing imaging equipment using ultrasonic as the media. It mainly uses high-frequency ultrasonic to detect all kinds of semiconductor devices and materials, and can detect the defects such as pores, cracks, inclusions and delamination inside the sample, and display them visually in a graphical way. In the scanning process, it will not cause damage to the sample and will not affect the performance of the sample, which can meet the quality control needs of ceramic substrate, IGBT, water-cooled radiator, battery, semiconductor, electrical welding parts, diamond composite materials, carbon fiber composite materials and other products.
Q: For which products?
A: Suitable for all kinds of semiconductor devices and other products requiring flaw detection.
Q: How to choose the right SAT?
A: Select according to different product sizes and functional requirements:
- Select the probe according to different product thicknesses
- Select models according to different scanning ranges
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